Farideh Golshan - Mountain View CA
Sun Microsystems, Inc. - Palo Alto CA
A system for coupling a Dynamic Termination Logic (DTL) type output driver to IEEE 1149. 1 boundary-scan circuitry includes a logic circuit that converts the data and output enable signals of the IEEE 1149. 1 specification to test "q_up," "q_dn" and "q25_dn" signals meeting the requirements of the DTL driver. These test q_up, q_dn and q25_dn are selectively provided to the DTL driver during boundary-scan testing of the output driver. In a further refinement, the system also converts functional q_up, q_dn and q25_dn signals provided by the circuit under test to the data and output enable signals of the IEEE 1149. 1 specification. The system allows the widely used IEEE 1149. 1 boundary-scan standard to be used with DTL drivers. The resulting compatibility simplifies the testing and use of the DTL drivers, and provides a new boundary-scan standard for use with DTL drivers that is compliant with the IEEE 1149. 1 standard.